Opto-Mechanical Engineering Expertise

20 years of advanced development in Optical Systems

Areas of Expertise:

  • Opto-mechanical Design
  • Lens Design
  • Tolerancing
  • Fine Mechanics
  • Optical Alignment Methods
  • Kinematic / Exact Constraint Design
  • Finite Element Analysis
  • Project Management
  • Technical Leadership
  • Product Development
  • Innovation
  • Low Stress Lens Mounting


• F. DeWitt, P. Flug, “Enabling streamlined quality control with XONOX IQC”, Proc. SPIE Vol. 11889, 2021
• M. Mestre, F. DeWitt, “Mastering the effects of air turbulence in optical components interferometric metrology”, Proc. Vol. 11889, 2021
• F. DeWitt, “Development of a mirror mount suitable for laboratory and OEM applications”, Proc SPIE Vol 11100-02, 2019 
• F. DeWitt, “A novel mirror mount design suitable for laboratory and OEM applications”, Proc SPIE Vol 10747-12, 2018 
• G. Nadorff, F. DeWitt, “Reflaxicon Objectives for Imaging”, Proc. SPIE Vol. 8486-15, 2012
• G. Nadorff, F. DeWitt, Sten Lindau, “Variable xy-UV Beam Expander for High-Power Laser Beam Shaping”, Proc. SPIE Vol. 8490-18, 2012
• F. DeWitt, D. Durfee, S. Stephenson, G. Wagner, “Development of Shutter Subsystems for Infrared
Imagers”, Proc. SPIE Vol. DS100, 2010
• F. DeWitt, “An inverse kinematic approach to hexapod design and control” Proc. SPIE Vol. 7424, 2009
• F. DeWitt, G. Nadorff, “Understanding and predicting self-weight distortion of lens elements”, Laser Focus World, online feature article 289229, May 2007
• F. DeWitt, G. Nadorff, M. Naradikian “Self-weight Distortion of Lens Elements”, Proc. SPIE Vol. 6288, 2006
• F. DeWitt, G. Nadorff, “Rigid Body Movements of Lens Elements due to Opto-Mechanical Factors”, Proc. SPIE Vol. 5867-17, 2005
• H. Urey, F. DeWitt, P. A. Lopez, J. Tauscher, “MEMS sinusoidal raster correction scanner for high-performance displays”, Proc. SPIE Vol. 4985-11, 2003
• F. DeWitt, B. Ng, “Integrated light modulation system for multi-beam RSD systems”, Proc. SPIE Vol. 4711-24, 2002
• H. Urey, F. DeWitt, S. Luanava, “Optical scanners for high resolution RSD systems”, Proc SPIE Vol. 4711-21, 2002
• H. Urey, F. DeWitt, K. Powell, M. Bayer, “High frequency raster pinch correction scanner for retinal scanning displays”, Proc. SPIE Vol. 4561-06, 2001


• United States Patent 7071594, “MEMS scanner with dual magnetic and capacitive drive”
• United States Patent 8238042, “Reflective axicon systems and methods”
• United States Patent 8511876, “On-Axis Monolithic Ellipsoidal Lens for Coupling Systems”
• United States Patent 8686718, “Magnetic shutter blade position sensing method”
• United States Patent 8956059, “Shutter with Power-Free Magnetic Detent”
• United States Patent 10901202, “Structured illumination of a sample”
• United States Patent 11029485, “Optical mount”

For Engineering Services contact Frank DeWitt at:


JAID Technologies, Inc. is located in the Greater Rochester NY area